Citation: Hy. Nie et al., Draw-ratio-dependent morphology of biaxially oriented polypropylene films as determined by atomic force microscopy, POLYMER, 41(6), 2000, pp. 2213-2218
Citation: Hy. Nie et al., Microscopic stripe formation and adhesion force increase introduced by local shear-stress deformation of polypropylene film, LANGMUIR, 15(19), 1999, pp. 6484-6489
Citation: Hy. Nie et al., Atomic force microscopy study of polypropylene surfaces treated by UV and ozone exposure: modification of morphology and adhesion force, APPL SURF S, 145, 1999, pp. 627-632
Authors:
Nie, HY
Walzak, MJ
McIntyre, NS
El-Sherik, AM
Citation: Hy. Nie et al., Application of lateral force imaging to enhance topographic features of polypropylene film and photo-cured polymers, APPL SURF S, 145, 1999, pp. 633-637
Authors:
Walzak, MJ
McIntyre, NS
Prater, T
Kaberline, S
Graham, BA
Citation: Mj. Walzak et al., Detection and mapping of chimassorb 944FD antioxidant additive in polyethylene using TOF-SIMS, ANALYT CHEM, 71(7), 1999, pp. 1428-1430