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Results:
1-2
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Results: 2
Surface segregation of Al of the bilayers of pure Cu and Cu-Al alloy films
Authors:
Wang, PI Murarka, SP Kaminski, DA Bedell, S Lanford, WA
Citation:
Pi. Wang et al., Surface segregation of Al of the bilayers of pure Cu and Cu-Al alloy films, J ELCHEM SO, 148(9), 2001, pp. G481-G486
Evolution of the Cu-Al alloy/SiO2 interfaces during bias temperature stressing
Authors:
Wang, PI Murarka, SP Yang, GR Lu, TM
Citation:
Pi. Wang et al., Evolution of the Cu-Al alloy/SiO2 interfaces during bias temperature stressing, J ELCHEM SO, 148(2), 2001, pp. G78-G81
Risultati:
1-2
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