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Results:
1-2
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Results: 2
MOSFET 1/f noise measurement under switched bias conditions
Authors:
van der Wel, AP Klumperink, EAM Gierkink, SLJ Wassenaar, RF Wallinga, H
Citation:
Ap. Van Der Wel et al., MOSFET 1/f noise measurement under switched bias conditions, IEEE ELEC D, 21(1), 2000, pp. 43-46
Some design aspects of a two-stage rail-to-rail CMOS op amp
Authors:
Gierkink, SLJ Holzmann, PJ Wiegerink, RJ Wassenaar, RF
Citation:
Slj. Gierkink et al., Some design aspects of a two-stage rail-to-rail CMOS op amp, ANALOG IN C, 21(2), 1999, pp. 143-152
Risultati:
1-2
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