Authors: Harame, DL Ahlgren, DC Coolbaugh, DD Dunn, JS Freeman, GG Gillis, JD Groves, RA Hendersen, GN Johnson, RA Joseph, AJ Subbanna, S Victor, AM Watson, KM Webster, CS Zampardi, PJ

Citation: Dl. Harame et al., Current status and future trends of SiGeBiCMOS technology, IEEE DEVICE, 48(11), 2001, pp. 2575-2594

Authors: Clark, WF Ference, TG Hook, TB Watson, KM Mittl, SW Burnham, JS

Citation: Wf. Clark et al., Process stability of deuterium-annealed MOSFET's, IEEE ELEC D, 20(1), 1999, pp. 48-50

Authors: Watson, KM

Citation: Km. Watson, Interaction of capillary waves with longer waves. Part 2. Applications to waves in two surface dimensions and to waves in shallow water, J FLUID MEC, 397, 1999, pp. 99-117

Authors: Ference, TG Burnham, JS Clark, WF Hook, TB Mittl, SW Watson, KM Han, LKK

Citation: Tg. Ference et al., The combined effects of deuterium anneals and deuterated barrier-nitride processing on hot-electron degradation in MOSFET's, IEEE DEVICE, 46(4), 1999, pp. 747-753