Authors: Wiedemann, R Oettel, H Bertram, T Weihnacht, V

Citation: R. Wiedemann et al., Mechanical properties of TiN coatings, ADV ENG MAT, 3(11), 2001, pp. 865-870

Authors: Weihnacht, V Bruckner, W

Citation: V. Weihnacht et W. Bruckner, Dislocation accumulation and strengthening in Cu thin films, ACT MATER, 49(13), 2001, pp. 2365-2372

Authors: Bruckner, W Weihnacht, V Pitschke, W Thomas, J Baunack, S

Citation: W. Bruckner et al., Abnormal grain growth of sputtered CuNi(Mn) thin films, J MATER RES, 15(5), 2000, pp. 1062-1068

Authors: Weihnacht, V Bruckner, W Schneider, CM

Citation: V. Weihnacht et al., Apparatus for thin-film stress measurement with integrated four-point bending equipment: Performance and results on Cu films, REV SCI INS, 71(12), 2000, pp. 4479-4482

Authors: Wiedemann, R Weihnacht, V Oettel, H

Citation: R. Wiedemann et al., Structure and mechanical properties of amorphous Ti-B-N coatings, SURF COAT, 119, 1999, pp. 302-309

Authors: Bruckner, W Weihnacht, V

Citation: W. Bruckner et V. Weihnacht, Stress relaxation in CuNi thin films, J APPL PHYS, 85(7), 1999, pp. 3602-3608