Authors:
Yoon, SG
Wicaksana, D
Kim, DJ
Kim, SH
Kingon, AI
Citation: Sg. Yoon et al., Effect of hydrogen on true leakage current characteristics of (Pb,La)(Zr,Ti)O-3 thin-film capacitors with Pt- or Ir-based top electrodes, J MATER RES, 16(4), 2001, pp. 1185-1189