Authors:
Wieland, M
Textor, M
Spencer, ND
Brunette, DM
Citation: M. Wieland et al., Wavelength-dependent roughness: A quantitative approach to characterizing the topography of rough titanium surfaces, INT J O M I, 16(2), 2001, pp. 163-181
Authors:
Vogt, U
Stiel, H
Will, I
Nickles, PV
Sandner, W
Wieland, M
Wilhein, T
Citation: U. Vogt et al., Influence of laser intensity and pulse duration on the extreme ultravioletyield from a water jet target laser plasma, APPL PHYS L, 79(15), 2001, pp. 2336-2338
Authors:
Prechtl, A
Harbeck, N
Thomssen, C
Meisner, C
Braun, M
Untch, M
Wieland, M
Lisboa, B
Cufer, T
Graeff, H
Selbmann, K
Schmitt, M
Janicke, F
Citation: A. Prechtl et al., Tumor-biological factors uPA and PAI-1 as stratification criteria of a multicenter adjuvant chemotherapy trial in node-negative breast cancer, INT J B MAR, 15(1), 2000, pp. 73-78
Authors:
Wieland, M
Hanggi, P
Hotz, W
Textor, M
Keller, BA
Spencer, ND
Citation: M. Wieland et al., Wavelength-dependent measurement and evaluation of surface topographies: application of a new concept of window roughness and surface transfer function, WEAR, 237(2), 2000, pp. 231-252
Authors:
Wieland, M
Hanggi, P
Hotz, W
Textor, M
Keller, BA
Spencer, ND
Citation: M. Wieland et al., Wavelength-dependent measurement and evaluation of surface topographies: application of a new concept of window roughness and surface transfer function, WEAR, 237(2), 2000, pp. 231-252
Authors:
Schwartz, Z
Lohmann, CH
Wieland, M
Cochran, DL
Dean, DD
Textor, M
Bonewald, LF
Boyan, BD
Citation: Z. Schwartz et al., Osteoblast proliferation and differentiation on dentin slices are modulated by pretreatment of the surface with tetracycline or osteoclasts, J PERIODONT, 71(4), 2000, pp. 586-597
Citation: Rg. Richards et al., Advantages of stereo imaging of metallic surfaces with low voltage backscattered electrons in a field emission scanning electron microscope, J MICROSC O, 199, 2000, pp. 115-123
Citation: Jmnt. Gray et al., Gravity-driven free surface flow of granular avalanches over complex basaltopography, P ROY SOC A, 455(1985), 1999, pp. 1841-1874
Authors:
Sittig, C
Textor, M
Spencer, ND
Wieland, M
Vallotton, PH
Citation: C. Sittig et al., Surface characterization of implant materials cp Ti, Ti-6Al-7Nb and Ti-6Al-4V with different pretreatments, J MAT S-M M, 10(1), 1999, pp. 35-46
Authors:
Leonard, D
Keller, B
Chevolot, Y
Wieland, M
Mathieu, HJ
Citation: D. Leonard et al., Round robin of time-of-flight secondary ion mass spectrometry damage studies of a photoimmobilized reagent on diamond surfaces designed for surface glycoengineering, APPL SURF S, 145, 1999, pp. 409-413
Citation: M. Wieland et al., Channelized free-surface flow of cohesionless granular avalanches in a chute with shallow lateral curvature, J FLUID MEC, 392, 1999, pp. 73-100