Authors: Kenny, MJ Leistner, AJ Walsh, CJ Fen, K Giardini, WJ Wielunski, LS Netterfield, RP Ward, BR

Citation: Mj. Kenny et al., Precision determination of the density of a single crystal silicon sphere and evaluation of the avogadro constant, IEEE INSTR, 50(2), 2001, pp. 587-592

Authors: Ikeyama, M Nakao, S Morikawa, H Yokogawa, Y Wielunski, LS Clissold, RA Bell, T

Citation: M. Ikeyama et al., Increase of surface hardness induced by O, Ca or P ion implantation into titanium, SURF COAT, 128, 2000, pp. 400-403

Authors: Elliman, RG Timmers, H Ophel, TR Weijers, TDM Wielunski, LS Harding, GL

Citation: Rg. Elliman et al., Simultaneous hydrogen detection with an ERD gas ionization detector, NUCL INST B, 161, 2000, pp. 231-234

Authors: Miyagawa, Y Nakao, S Wielunski, LS Hasegawa, H Miyagawa, S

Citation: Y. Miyagawa et al., Depth profiling of nitrogen implanted into Si/C and Zr/C bilayers with nuclear reaction analysis, NUCL INST B, 161, 2000, pp. 997-1001

Authors: Jin, P Nakao, S Tanemura, S Bell, T Wielunski, LS Swain, MV

Citation: P. Jin et al., Characterization of mechanical properties of VO2 thin films on sapphire and silicon by ultra-microindentation, THIN SOL FI, 344, 1999, pp. 134-137

Authors: Kenny, MJ Netterfield, RP Wielunski, LS Beaglehole, D

Citation: Mj. Kenny et al., Surface layer impurities on silicon spheres used in determination of the Avogadro constant, IEEE INSTR, 48(2), 1999, pp. 233-237