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Results: 1-12 |
Results: 12
The effects of boron impurities on the atomic bonding and electronic structure of Ni3Al
Authors: Winarski, RP Eskildsen, T Stadler, S van Ek, J Ederer, DL Kurmaev, EZ Grush, MM Callcott, TA Moewes, A Lee, M
Citation: Rp. Winarski et al., The effects of boron impurities on the atomic bonding and electronic structure of Ni3Al, J ELEC SPEC, 110(1-3), 2000, pp. 69-74
Electronic structures of the tungsten borides WB, W2B and W2B5
Authors: Stadler, S Winarski, RP MacLaren, JM Ederer, DL vanEk, J Moewes, A Grush, MM Callcott, TA Perera, RCC
Citation: S. Stadler et al., Electronic structures of the tungsten borides WB, W2B and W2B5, J ELEC SPEC, 110(1-3), 2000, pp. 75-86
Chemical reactions in polymers induced by ion beam mixing: fluorescence X-ray measurements
Authors: Kurmaev, EZ Winarski, RP Pivin, JC Ederer, DL Shamin, SN Moewes, A Endo, K Ida, T Chang, GS Whang, CN
Citation: Ez. Kurmaev et al., Chemical reactions in polymers induced by ion beam mixing: fluorescence X-ray measurements, J ELEC SPEC, 110(1-3), 2000, pp. 87-103
Soft X-ray scattering dominates emission near the giant resonance of the rare earth compounds
Authors: Moewes, A Stadler, S Winarski, RP Ederer, DL Callcott, TA
Citation: A. Moewes et al., Soft X-ray scattering dominates emission near the giant resonance of the rare earth compounds, J ELEC SPEC, 110(1-3), 2000, pp. 189-196
X-ray emission study of ion beam mixed Cu/Al films on polyimide
Authors: Kurmaev, EZ Zatsepin, DA Winarski, RP Stadler, S Ederer, DL Moewes, A Fedorenko, VV Shamin, SN Galakhov, VR Chang, GS Whang, CN
Citation: Ez. Kurmaev et al., X-ray emission study of ion beam mixed Cu/Al films on polyimide, J VAC SCI A, 17(2), 1999, pp. 593-596
Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films
Authors: Kurmaev, EZ Winarski, RP Ederer, DL Pivin, JC Shamin, SN Moewes, A Callcott, TA Chang, GS Whang, CN
Citation: Ez. Kurmaev et al., Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films, J ELEC SPEC, 103, 1999, pp. 565-571
Study of 4f inner shell excitations in Gd and Tb using resonant inelastic soft X-ray scattering
Authors: Moewes, A Winarski, RP Ederer, DL Grush, MM Callcott, TA
Citation: A. Moewes et al., Study of 4f inner shell excitations in Gd and Tb using resonant inelastic soft X-ray scattering, J ELEC SPEC, 103, 1999, pp. 617-622
Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy
Authors: Kurmaev, EZ Winarski, RP Endo, K Ida, T Moewes, A Ederer, DL Pivin, JC Shamin, SN Trofimova, VA Yarmoshenko, YM
Citation: Ez. Kurmaev et al., Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy, NUCL INST B, 155(4), 1999, pp. 431-439
X-ray fluorescence study of organic-inorganic polymer conversion into ceramics induced by ion irradiation
Authors: Kurmaev, EZ Moewes, A Krietemeyer, M Endo, K Ida, T Shimada, S Winarski, RP Neumann, M Shamin, SN Ederer, DL
Citation: Ez. Kurmaev et al., X-ray fluorescence study of organic-inorganic polymer conversion into ceramics induced by ion irradiation, PHYS REV B, 60(22), 1999, pp. 15100-15106
Soft X-ray fluorescence measurements of polyimide films
Authors: Winarski, RP Ederer, DL Kurmaev, EZ Shamin, SN Endo, K Ida, T Moewes, A Chang, GS Kim, SY Whang, CN
Citation: Rp. Winarski et al., Soft X-ray fluorescence measurements of polyimide films, THIN SOL FI, 357(2), 1999, pp. 91-97
Mechanism for interfacial adhesion strength of an ion beam mixed Cu/polyimide with a thin buffer layer
Authors: Chang, GS Chae, KH Whang, CN Kurmaev, EZ Zatsepin, DA Winarski, RP Ederer, DL Moewes, A Lee, YP
Citation: Gs. Chang et al., Mechanism for interfacial adhesion strength of an ion beam mixed Cu/polyimide with a thin buffer layer, APPL PHYS L, 74(4), 1999, pp. 522-524
Core-hole induced charge transfer and Coster-Kronig enhanced fluorescence at the 3d threshold of lanthanum studied by resonant inelastic scattering
Authors: Moewes, A Stadler, S Winarski, RP Ederer, DL Grush, MM Callcott, TA
Citation: A. Moewes et al., Core-hole induced charge transfer and Coster-Kronig enhanced fluorescence at the 3d threshold of lanthanum studied by resonant inelastic scattering, PHYS REV B, 58(24), 1998, pp. R15951-R15954
Risultati: 1-12 |