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Results:
1-8
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Results: 8
Authors:
Hall, TW
Herron, TL
Pierce, BJ
Witt, TJ
Citation: Tw. Hall et al., The effectiveness of increasing sample size to mitigate the influence of population characteristics in haphazard sampling, AUDITING, 20(1), 2001, pp. 169-185
Authors:
Reymann, D
Witt, TJ
Vrabcek, P
Tang, YH
Hamilton, CA
Katkov, AS
Jeanneret, B
Power, O
Citation: D. Reymann et al., Recent developments in BIPM voltage standard comparisons, IEEE INSTR, 50(2), 2001, pp. 206-209
Authors:
Witt, TJ
Citation: Tj. Witt, Using the Allan variance and power spectral density to characterize DC nanovoltmeters, IEEE INSTR, 50(2), 2001, pp. 445-448
Authors:
Witt, TJ
Reymann, D
Citation: Tj. Witt et D. Reymann, Using power spectra and Allan variances to characterise the noise of Zener-diode voltage standards, IEE P-SCI M, 147(4), 2000, pp. 177-182
Authors:
Delahaye, F
Witt, TJ
Elmquist, RE
Dziuba, RF
Citation: F. Delahaye et al., Comparison of quantum Hall effect resistance standards of the NIST and theBIPM, METROLOGIA, 37(2), 2000, pp. 173-176
Authors:
Reymann, D
Witt, TJ
Balmisa, J
Castejon, P
Perez, S
Citation: D. Reymann et al., Comparison of the Josephson voltage standards of the CEM and the BIPM, METROLOGIA, 36(1), 1999, pp. 59-62
Authors:
Reymann, D
Witt, TJ
Eklund, G
Pajander, H
Nilsson, H
Behr, R
Funck, T
Muller, F
Citation: D. Reymann et al., A three-way, on-site comparison of the 10 V Josephson voltage standards ofthe PTB, the SP, and the BIPM, IEEE INSTR, 48(2), 1999, pp. 257-261
Authors:
Witt, TJ
Citation: Tj. Witt, Pressure coefficients of some Zener diode-based electronic voltage standards, IEEE INSTR, 48(2), 1999, pp. 329-332
Risultati:
1-8
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