Authors: Manne, S Workman, RK Wolgemuth, JL

Citation: S. Manne et al., Mesoscopic films at interfaces, SURF SC S, 100, 2001, pp. 761-778

Authors: Wolgemuth, JL Workman, RK Manne, S

Citation: Jl. Wolgemuth et al., Surfactant aggregates at a flat, isotropic hydrophobic surface, LANGMUIR, 16(7), 2000, pp. 3077-3081

Authors: Workman, RK Manne, S

Citation: Rk. Workman et S. Manne, Variable temperature fluid stage for atomic force microscopy, REV SCI INS, 71(2), 2000, pp. 431-436

Authors: Peterson, CA Workman, RK Sarid, D Vermeire, B Parks, HG Adderton, D Maivald, P

Citation: Ca. Peterson et al., Effects of moisture on Fowler-Nordheim characterization of thin silicon-oxide films, J VAC SCI A, 17(5), 1999, pp. 2753-2758

Authors: Workman, RK Peterson, CA Sarid, D

Citation: Rk. Workman et al., Current-dependent growth of silicon nitride lines using a conducting tip AFM, SURF SCI, 423(2-3), 1999, pp. L277-L279

Authors: Peterson, CA Workman, RK Yao, XW Hunt, JP Sarid, D

Citation: Ca. Peterson et al., V-shaped metallic-wire cantilevers for combined atomic force microscopy and Fowler-Nordheim imaging, NANOTECHNOL, 9(4), 1998, pp. 331-336