Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-1
|
Results: 1
Influence analysis of dwell time on focused ion beam micromachining in silicon
Authors:
Fu, YQ Bryan, NKA Shing, ON Wyan, HNP
Citation:
Yq. Fu et al., Influence analysis of dwell time on focused ion beam micromachining in silicon, SENS ACTU-A, 79(3), 2000, pp. 230-234
Risultati:
1-1
|