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Results:
1-4
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Results: 4
MASK DEFECT PRINTABILITY AND WAFER PROCESS CRITICAL DIMENSION CONTROLAT 0.25 MU-M DESIGN RULES
Authors:
YAN PY LANGSTON J NEFF J CHATTERJEE R
Citation:
Py. Yan et al., MASK DEFECT PRINTABILITY AND WAFER PROCESS CRITICAL DIMENSION CONTROLAT 0.25 MU-M DESIGN RULES, JPN J A P 1, 34(12B), 1995, pp. 6605-6610
EXPONENTIAL SIZE LOWER BOUNDS FOR SOME DEPTH 3 CIRCUITS
Authors:
YAN PY PARBERRY I
Citation:
Py. Yan et I. Parberry, EXPONENTIAL SIZE LOWER BOUNDS FOR SOME DEPTH 3 CIRCUITS, Information and computation, 112(1), 1994, pp. 117-130
ONLINE NAVIGATION IN A ROOM
Authors:
BARELI E BERMAN P FIAT A YAN PY
Citation:
E. Bareli et al., ONLINE NAVIGATION IN A ROOM, Journal of algorithms, 17(3), 1994, pp. 319-341
COMMUNICATION-SPACE TRADEOFFS FOR UNRESTRICTED PROTOCOLS
Authors:
BEAME P TOMPA M YAN PY
Citation:
P. Beame et al., COMMUNICATION-SPACE TRADEOFFS FOR UNRESTRICTED PROTOCOLS, SIAM journal on computing, 23(3), 1994, pp. 652-661
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