Authors: SHEN SJ YANG ECS WONG WJ WANG YS LIN CJ LIANG MS HSU CCH

Citation: Sj. Shen et al., DEGRADATION OF FLASH MEMORY USING DRAIN-AVALANCHE HOT-ELECTRON (DAHE)SELF-CONVERGENCE OPERATION SCHEME, JPN J A P 2, 37(7A), 1998, pp. 778-780