Authors: Parretta, A Yakubu, H Ferrazza, F

Citation: A. Parretta et al., Method for measurement of the hemispherical/hemispherical reflectance of photovoltaic devices, OPT COMMUN, 194(1-3), 2001, pp. 17-32

Authors: Yakubu, H Thilakan, P

Citation: H. Yakubu et P. Thilakan, Study of the electrical and junction properties of ITO thin films deposited on CdTe and InP substrates, RENEW ENERG, 20(2), 2000, pp. 155-165

Authors: Yakubu, H

Citation: H. Yakubu, Investigations of the reverse current-voltage characteristics of ITO-p CdTe heterojunction solar cells, RENEW ENERG, 17(1), 1999, pp. 61-71

Authors: Parretta, A Sarno, A Tortora, P Yakubu, H Maddalena, P Zhao, JH Wang, AH

Citation: A. Parretta et al., Angle-dependent reflectance measurements on photovoltaic materials and solar cells, OPT COMMUN, 172(1-6), 1999, pp. 139-151

Authors: Parretta, A Sarno, A Yakubu, H

Citation: A. Parretta et al., Non-destructive optical characterization of photovoltaic modules by an integrating sphere. Part I: Mono-Si modules, OPT COMMUN, 161(4-6), 1999, pp. 297-309