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Kotera, M
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Shimada, T
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Authors:
Kotera, M
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Okagawa, T
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Yamabe, M
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Authors:
Kotera, M
Yamaguchi, K
Okagawa, T
Matsuoka, K
Kojima, Y
Yamabe, M
Citation: M. Kotera et al., Characteristic variation of exposure pattern in cell-projection electron-beam lithography, JPN J A P 1, 38(12B), 1999, pp. 7031-7034
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Authors:
Tanaka, Y
Taguchi, T
Fujii, K
Tsuboi, S
Yamabe, M
Suzuki, K
Gomei, Y
Hisatsugu, T
Fukuda, M
Morita, H
Citation: Y. Tanaka et al., 130 nm and 150 nm line-and-space critical-dimension control evaluation using XS-1 x-ray stepper, J VAC SCI B, 16(6), 1998, pp. 3509-3514