Authors:
Kalitzova, M
Zollo, G
Yankov, R
Angelov, C
Simov, S
Pizzuto, C
Faure, J
Kilian, L
Bonhomme, P
Manno, D
Voelskow, M
Vitali, G
Citation: M. Kalitzova et al., Ion-beam-assisted nanocrystal formation in silicon implanted with high doses of Pb+ and Bi+ ions, JPN J A P 1, 40(10), 2001, pp. 5841-5849
Authors:
Exerowa, D
Kolarov, T
Esipova, NE
Yankov, R
Zorin, ZM
Citation: D. Exerowa et al., Foam and wetting films from aqueous cetyltrimethylammonium bromide solutions: Electrostatic stability, COLL J, 63(1), 2001, pp. 45-52
Authors:
Anwand, W
Brauer, G
Coleman, PG
Yankov, R
Skorupa, W
Citation: W. Anwand et al., Characterization of vacancy-type defects in Al+ and N+ co-implanted SiC byslow positron implantation spectroscopy, APPL SURF S, 149(1-4), 1999, pp. 140-143
Authors:
Manova, D
Dimitrova, V
Karpuzov, D
Yankov, R
Citation: D. Manova et al., Reactively DC magnetron sputtered thin AlN films studied by x-ray photoelectron spectroscopy and polarised infrared reflection, VACUUM, 52(3), 1999, pp. 301-305