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Results: 1-25 | 26-37 |
Results: 26-37/37
INTERFACIAL DEPTH PROFILING OF SUPERCONDUCTING HIGH-T(C) MONOLAYER AND MULTILAYER STRUCTURES BY AUGER-ELECTRON SPECTROSCOPY
Authors: SEIBT EW ZALAR A PANJAN P
Citation: Ew. Seibt et al., INTERFACIAL DEPTH PROFILING OF SUPERCONDUCTING HIGH-T(C) MONOLAYER AND MULTILAYER STRUCTURES BY AUGER-ELECTRON SPECTROSCOPY, Surface and interface analysis, 22(1-12), 1994, pp. 380-386
INTERFACIAL REACTIONS AND SILICIDE FORMATION IN SI NI/SI AND SI/CR/SISANDWICH LAYERS/
Authors: ZALAR A HOFMANN S PIMENTEL F PANJAN P
Citation: A. Zalar et al., INTERFACIAL REACTIONS AND SILICIDE FORMATION IN SI NI/SI AND SI/CR/SISANDWICH LAYERS/, Surface and interface analysis, 21(8), 1994, pp. 560-565
DEPTH PROFILING WITH SAMPLE ROTATION - CAPABILITIES AND LIMITATIONS
Authors: HOFMANN S ZALAR A
Citation: S. Hofmann et A. Zalar, DEPTH PROFILING WITH SAMPLE ROTATION - CAPABILITIES AND LIMITATIONS, Surface and interface analysis, 21(5), 1994, pp. 304-309
ON THE PLASMA DEPOSITION OF DIAMOND FILMS
Authors: MOZETIC M ZALAR A KVEDER M DROBNIC M
Citation: M. Mozetic et al., ON THE PLASMA DEPOSITION OF DIAMOND FILMS, Vacuum, 45(10-11), 1994, pp. 1017-1018
DETERMINATION OF ATOMIC-HYDROGEN DENSITY WITH CATALYTIC PROBES
Authors: MOZETIC M KVEDER M DROBNIC M PAULIN A ZALAR A
Citation: M. Mozetic et al., DETERMINATION OF ATOMIC-HYDROGEN DENSITY WITH CATALYTIC PROBES, Vacuum, 45(10-11), 1994, pp. 1095-1097
INTERFACIAL REACTIONS IN DYNAMICALLY HEATED SI ME/SI SANDWICH LAYERS/
Authors: ZALAR A HOFMANN S PIMENTEL F PANJAN P
Citation: A. Zalar et al., INTERFACIAL REACTIONS IN DYNAMICALLY HEATED SI ME/SI SANDWICH LAYERS/, Thin solid films, 253(1-2), 1994, pp. 293-298
AUGER-ELECTRON SPECTROSCOPY ROTATIONAL DEPTH PROFILING OF NI CR MULTILAYERS USING O2+ AND AR+ IONS
Authors: ZALAR A SEIBT EW PANJAN P
Citation: A. Zalar et al., AUGER-ELECTRON SPECTROSCOPY ROTATIONAL DEPTH PROFILING OF NI CR MULTILAYERS USING O2+ AND AR+ IONS, Thin solid films, 246(1-2), 1994, pp. 35-41
ELECTRON RADIATION-INDUCED EFFECTS IN AUGER-ELECTRON SPECTROSCOPIC CHARACTERIZATION OF HIGH-T-C SUPERCONDUCTORS
Authors: SEIBT EW ZALAR A ROOSE N
Citation: Ew. Seibt et al., ELECTRON RADIATION-INDUCED EFFECTS IN AUGER-ELECTRON SPECTROSCOPIC CHARACTERIZATION OF HIGH-T-C SUPERCONDUCTORS, Analytica chimica acta, 297(1-2), 1994, pp. 153-164
COMPARISON OF ROTATIONAL DEPTH PROFILING WITH AES AND XPS
Authors: ZALAR A HOFMANN S
Citation: A. Zalar et S. Hofmann, COMPARISON OF ROTATIONAL DEPTH PROFILING WITH AES AND XPS, Applied surface science, 68(3), 1993, pp. 361-367
INTERLABORATORY COMPARISON OF THE DEPTH RESOLUTION IN SPUTTER DEPTH PROFILING OF NI CR MULTILAYERS WITH AND WITHOUT SAMPLE ROTATION USING AES, XPS AND SIMS/
Authors: HOFMANN S ZALAR A CIRLIN EH VAJO JJ MATHIEU HJ PANJAN P
Citation: S. Hofmann et al., INTERLABORATORY COMPARISON OF THE DEPTH RESOLUTION IN SPUTTER DEPTH PROFILING OF NI CR MULTILAYERS WITH AND WITHOUT SAMPLE ROTATION USING AES, XPS AND SIMS/, Surface and interface analysis, 20(8), 1993, pp. 621-626
AUGER-ELECTRON SPECTROSCOPY STUDIES OF INTERFACIAL REACTIONS IN METALSEMICONDUCTOR MULTILAYERS ACTIVATED DURING DIFFERENTIAL SCANNING CALORIMETRY MEASUREMENTS/
Authors: ZALAR A HOFMANN S PIMENTEL F PANJAN P
Citation: A. Zalar et al., AUGER-ELECTRON SPECTROSCOPY STUDIES OF INTERFACIAL REACTIONS IN METALSEMICONDUCTOR MULTILAYERS ACTIVATED DURING DIFFERENTIAL SCANNING CALORIMETRY MEASUREMENTS/, Thin solid films, 236(1-2), 1993, pp. 169-172
A STUDY OF THERMALLY ACTIVATED INTERFACIAL REACTIONS IN AN NI CR/SI MULTILAYER STRUCTURE/
Authors: PIMENTEL F ZALAR A HOFMANN S KOHL D PANJAN P
Citation: F. Pimentel et al., A STUDY OF THERMALLY ACTIVATED INTERFACIAL REACTIONS IN AN NI CR/SI MULTILAYER STRUCTURE/, Thin solid films, 228(1-2), 1993, pp. 149-153
Risultati: 1-25 | 26-37 |