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Results: 26-33/33
Authors:
LIN CJ
ZORIAN Y
BHAWMIK S
Citation: Cj. Lin et al., INTEGRATION OF PARTIAL SCAN AND BUILT-IN SELF-TEST, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 7(1-2), 1995, pp. 125-137
Authors:
WAGNER KD
ZORIAN Y
Citation: Kd. Wagner et Y. Zorian, EIC MESSAGE, IEEE design & test of computers, 12(1), 1995, pp. 2
Authors:
MALY W
ZORIAN Y
Citation: W. Maly et Y. Zorian, SPECIAL SECTION ON THE 12TH IEEE VLSI SYMPOSIUM, IEEE transactions on computer-aided design of integrated circuits and systems, 14(5), 1995, pp. 529-530
Authors:
AGRAWAL VD
LIN CJ
RUTKOWSKI PW
WU SL
ZORIAN Y
Citation: Vd. Agrawal et al., BUILT-IN SELF-TEST FOR DIGITAL INTEGRATED-CIRCUITS, AT&T technical journal, 73(2), 1994, pp. 30-39
Authors:
ZORIAN Y
Citation: Y. Zorian, A STRUCTURED TESTABILITY APPROACH FOR MULTICHIP MODULES BASED ON BISTAND BOUNDARY-SCAN, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 17(3), 1994, pp. 283-290
Authors:
VANDEGOOR AJ
ZORIAN Y
Citation: Aj. Vandegoor et Y. Zorian, EFFECTIVE MARCH ALGORITHMS FOR TESTING SINGLE-ORDER ADDRESSED MEMORIES, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 5(4), 1994, pp. 337-345
Authors:
ZORIAN Y
Citation: Y. Zorian, 1ST EUROPEAN DESIGN AND TEST CONFERENCE, IEEE design & test of computers, 11(3), 1994, pp. 3-3
Authors:
GHEEWALA T
MALY W
ZORIAN Y
BAKER K
ILLMAN R
AMBLER T
Citation: T. Gheewala et al., TEST ECONOMICS - IN COOPERATION WITH THE 1994 EUROPEAN DESIGN AND TEST CONFERENCE, IEEE design & test of computers, 11(3), 1994, pp. 70-77