Authors: ZUIKER CD GRUEN DM KRAUSS AR

Citation: Cd. Zuiker et al., IN-SITU LASER REFLECTANCE INTERFEROMETRY MEASUREMENT OF DIAMOND FILM GROWTH, Journal of applied physics, 79(7), 1996, pp. 3541-3547

Authors: GRUEN DM KRAUSS AR ZUIKER CD CSENCSITS R TERMINELLO LJ CARLISLE JA JIMENEZ I SUTHERLAND DGJ SHUH DK TONG W HIMPSEL FJ

Citation: Dm. Gruen et al., CHARACTERIZATION OF NANOCRYSTALLINE DIAMOND FILMS BY CORE-LEVEL PHOTOABSORPTION, Applied physics letters, 68(12), 1996, pp. 1640-1642

Authors: ZUIKER CD GRUEN DM KRAUSS AR

Citation: Cd. Zuiker et al., LASER-REFLECTANCE INTERFEROMETRY MEASUREMENTS OF DIAMOND-FILM GROWTH, MRS bulletin, 20(5), 1995, pp. 29-31

Authors: GRUEN DM ZUIKER CD KRAUSS AR PAN XZ

Citation: Dm. Gruen et al., CARBON DIMER, C-2 AS A GROWTH SPECIES FOR DIAMOND FILMS FROM METHANE HYDROGEN/ARGON MICROWAVE PLASMAS/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1628-1632

Authors: KRAUSS AR IM J SCHULTZ JA SMENTKOWSKI VS WATERS K ZUIKER CD GRUEN DM CHANG RPH

Citation: Ar. Krauss et al., PULSED ION-BEAM CHARACTERIZATION OF CVD DIAMOND SURFACES UNDER THIN-FILM DEPOSITION CONDITIONS, Thin solid films, 270(1-2), 1995, pp. 130-136