Authors:
ZWEBEN SH
EDWARDS SH
WEIDE BW
HOLLINGSWORTH JE
Citation: Sh. Zweben et al., THE EFFECTS OF LAYERING AND ENCAPSULATION ON SOFTWARE-DEVELOPMENT COST AND QUALITY, IEEE transactions on software engineering, 21(3), 1995, pp. 200-208
Citation: As. Parrish et Sh. Zweben, ON THE RELATIONSHIPS AMONG THE ALL-USES, ALL-DU-PATHS, AND ALL-EDGES TESTING CRITERIA, IEEE transactions on software engineering, 21(12), 1995, pp. 1006-1009
Citation: As. Parrish et Sh. Zweben, CLARIFYING SOME FUNDAMENTAL-CONCEPTS IN SOFTWARE TESTING, IEEE transactions on software engineering, 19(7), 1993, pp. 742-746