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Results: 1
Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM
Authors:
Haider, M Uhlemann, S Zach, J
Citation:
M. Haider et al., Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM, ULTRAMICROS, 81(3-4), 2000, pp. 163-175
Risultati:
1-1
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