Authors: Kundu, S Zachariah, ST Sengupta, S Galivanche, R

Citation: S. Kundu et al., Test challenges in nanometer technologies, J ELEC TEST, 17(3-4), 2001, pp. 209-218

Authors: Chakravarty, S Zachariah, ST

Citation: S. Chakravarty et St. Zachariah, STBM: A fast algorithm to simulate I-DDQ tests for leakage faults, IEEE COMP A, 19(5), 2000, pp. 568-576