Authors: Blauw, MA Zijlstra, T Bakker, RA van der Drift, E

Citation: Ma. Blauw et al., Kinetics and crystal orientation dependence in high aspect ratio silicon dry etching, J VAC SCI B, 18(6), 2000, pp. 3453-3461

Authors: Andriesse, MS Zijlstra, T van der Drift, E

Citation: Ms. Andriesse et al., High speed anisotropic dry etching of CoNbZr for next generation magnetic recording, J VAC SCI B, 18(6), 2000, pp. 3462-3466

Authors: Vossen, DLJ de Dood, MJA van Dillen, T Zijlstra, T van der Drift, E Polman, A van Blaaderen, A

Citation: Dlj. Vossen et al., Novel method for solution growth of thin silica films from tetraethoxysilane, ADVAN MATER, 12(19), 2000, pp. 1434-1437

Authors: Lukey, PW Caro, J Zijlstra, T van der Drift, E Radelaar, S

Citation: Pw. Lukey et al., The influence of strain relaxation on the electrical properties of submicron Si/SiGe resonant-tunneling diodes, ANALOG IN C, 24(1), 2000, pp. 27-35

Authors: Zijlstra, T Heimberg, JA van der Drift, E van Loon, DG Dienwiebel, M de Groot, LEM Frenken, JWM

Citation: T. Zijlstra et al., Fabrication of a novel scanning probe device for quantitative nanotribology, SENS ACTU-A, 84(1-2), 2000, pp. 18-24

Authors: Zijlstra, T van der Drift, E de Dood, MJA Snoeks, E Polman, A

Citation: T. Zijlstra et al., Fabrication of two-dimensional photonic crystal waveguides for 1.5 mu m insilicon by deep anisotropic dry etching, J VAC SCI B, 17(6), 1999, pp. 2734-2739