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Citation: T. Fuller et al., The critical thickness of silicon-germanium layers grown by liquid phase epitaxy, APPL PHYS A, 69(6), 1999, pp. 597-603

Authors: Zipprich, J Fuller, T Banhart, F Schmidt, OG Eberl, K

Citation: J. Zipprich et al., The quantitative characterization of SiGe layers by analysing rocking profiles in CBED patterns, J MICROSC O, 194, 1999, pp. 12-20