Authors: Holt, M Zschack, P Hong, H Chou, MY Chiang, TC

Citation: M. Holt et al., X-ray studies of phonon softening in TiSe2, PHYS REV L, 86(17), 2001, pp. 3799-3802

Authors: Hong, H Wu, Z Chiang, TC Zschack, P Jemian, P Chen, H Aburano, RD

Citation: H. Hong et al., Reflection surface x-ray diffraction patterns: k-space images, REV SCI INS, 71(8), 2000, pp. 3132-3137

Authors: Wu, Z Hong, HW Aburano, R Zschack, P Jemian, P Tischler, J Chen, HD Luh, DA Chiang, TC

Citation: Z. Wu et al., Pattern of x-ray scattering by thermal phonons in Si, PHYS REV B, 59(5), 1999, pp. 3283-3286

Authors: Holt, M Wu, Z Hong, HW Zschack, P Jemian, P Tischler, J Chen, H Chiang, TC

Citation: M. Holt et al., Determination of phonon dispersions from X-ray transmission scattering: The example of silicon, PHYS REV L, 83(16), 1999, pp. 3317-3319

Authors: Robertson, JL Ice, GE Sparks, CJ Jiang, X Zschack, P Bley, F Lefebvre, S Bessiere, M

Citation: Jl. Robertson et al., Local atomic arrangements in Fe63.2Ni36.8 invar from diffuse X-ray scattering measurements, PHYS REV L, 82(14), 1999, pp. 2911-2914