Authors:
Gubicza, J
Szepvolgyi, J
Mohai, I
Zsoldos, L
Ungar, T
Citation: J. Gubicza et al., Particle size distribution and dislocation density determined by high resolution X-ray diffraction in nanocrystalline silicon nitride powders, MAT SCI E A, 280(2), 2000, pp. 263-269