Authors: Nelson, MP Zugates, CT Treado, PJ Casuccio, GS Exline, DL Schlaegle, SF

Citation: Mp. Nelson et al., Combining Raman chemical imaging and scanning electron microscopy to characterize ambient fine particulate matter, AEROS SCI T, 34(1), 2001, pp. 108-117

Authors: Myers, TH Ptak, AJ VanMil, BL Moldovan, M Treado, PJ Nelson, MP Ribar, JM Zugates, CT

Citation: Th. Myers et al., Point defect modification in wide band gap semiconductors through interaction with high-energy electrons: Is reflection high-energy electron diffraction truly benign?, J VAC SCI B, 18(4), 2000, pp. 2295-2299

Authors: Schoonover, JR Saab, A Bridgewater, JS Havrilla, GJ Zugates, CT Treado, PJ

Citation: Jr. Schoonover et al., Raman/SEM chemical imaging of a residual gallium phase in a mixed oxide feed surrogate, APPL SPECTR, 54(9), 2000, pp. 1362-1371