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Results:
1-3
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Results: 3
Authors:
Houssa, M
De Gendt, S
de Bokx, P
Mertens, PW
Heyns, MM
Citation: M. Houssa et al., Effect of x-ray irradiation on the electrical characteristics of ultra-thin gate oxides, SEMIC SCI T, 14(9), 1999, pp. 741-746
Authors:
Houssa, M
De Gendt, S
de Bokx, P
Mertens, PW
Heyns, MM
Citation: M. Houssa et al., X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides, MICROEL ENG, 48(1-4), 1999, pp. 43-46
Authors:
Claes, M
de Bokx, P
Van Grieken, R
Citation: M. Claes et al., Progress in laboratory grazing emission X-ray fluorescence spectrometry, X-RAY SPECT, 28(4), 1999, pp. 224-229
Risultati:
1-3
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