Authors: Palasantzas, G de Hosson, JTM

Citation: G. Palasantzas et Jtm. De Hosson, Wetting on rough surfaces, ACT MATER, 49(17), 2001, pp. 3533-3538

Authors: Chechenin, NG van Veen, A Galindo, RE Schut, H Chezan, AR Bronsveld, PM de Hosson, JTM Boerma, DO

Citation: Ng. Chechenin et al., Positron annihilation and transmission electron microscopy study of the evolution of microstructure in cold-rolled and nitrided FeNiTi foils, J PHYS-COND, 13(26), 2001, pp. 5937-5946

Authors: Strondl, C van der Kolk, GJ Hurkmans, T Fleischer, W Trinh, T Carvalho, NM de Hosson, JTM

Citation: C. Strondl et al., Properties and characterization of multilayers of carbides and diamond-like carbon, SURF COAT, 142, 2001, pp. 707-713

Authors: Palasantzas, G de Hosson, JTM

Citation: G. Palasantzas et Jtm. De Hosson, Influence of proximity effects in superconductor/normal- metal junctions from mound roughness and film growth mechanisms, PHYSICA C, 330(1-2), 2000, pp. 99-104

Authors: Kooi, BJ Kabel, M Kloosterman, AB de Hosson, JTM

Citation: Bj. Kooi et al., Reaction layers around SiC particles in Ti: An electron microscopy study, ACT MATER, 47(10), 1999, pp. 3105-3116

Authors: van Veen, A Schut, H Fedorov, AV Neeft, EAC Konings, RJM Kooi, BJ de Hosson, JTM

Citation: A. Van Veen et al., Hydrogen implantation defects in MgO, NUCL INST B, 147(1-4), 1999, pp. 216-220