Authors:
Cremona, M
Mauricio, MHP
Fehlberg, LV
Nunes, RA
do Carmo, LCS
de Avillez, RR
Caride, AO
Citation: M. Cremona et al., Grazing incidence X-ray diffraction analysis of alkali fluoride thin filmsfor optical devices, THIN SOL FI, 333(1-2), 1998, pp. 157-164