01454nas a2200301 a 4500001001200000003000800012005001700020007000300037008004100040022001400081024002000095024002500115035002000140040000900160082001300169082001000182082001300192082000900205222003700214245003700251260003700288264042600325264004200751780006000793776006600853856010200919856013101021itacnp53263IT-ACNP20250121070000.0ta920519 19649999      p             engta  a0026-27147 aP 000801622CNR7 aitacnp532632IT-ACNP  a(ISSN)0026-2714  aacnp  a621.3815  aNULL}  a{621.381  aNULL 0aMicroelectronics and reliability00aMicroelectronics and reliability  aNew York. OxfordbPergamon Press 2cData export is allowed to ACNP participating libraries for institutional purposes and to individuals for personal, non-commercial uses only. Please contact the Bologna University ACNP Team ( acnp.sba.unibo.it/chi-siamo/staff-acnp ) to request permission to use exported data outside the scope of the above license, including but not limited to republication to a group or republishing the website or parts of the website. 4bUniversità di Bolognaccopyright20261 tElectronics reliability and microminiaturizationw493531 tMicroelectronics and reliability (Online)w2107614x1872-941X40aacnp.unibo.itnACNP Italian Union Catalogue of Serialsuhttps://acnpsearch.unibo.it/journal/5326340aacnp.sba.unibo.it/nARPAC Area Patrimonio Culturale - Università di Bolognamacnp.support@unibo.ituhttps://acnp.sba.unibo.it