A. Korkmaz et L. Tumkaya, ESTIMATION OF THE SECTION THICKNESS AND OPTICAL DISECTOR HEIGHT WITH A SIMPLE CALIBRATION METHOD, Journal of Microscopy, 187, 1997, pp. 104-109
The distance between the upper and lower surfaces of a section (i.e. t
he section thickness) can be measured with a microcator or a shaft enc
oder. In the present report, an alternative simple method is described
for estimating the section thickness where such equipment is not avai
lable. The basic principle of the method is based on a calibration met
hod already described in the literature, The main difference is that i
t enables one to make more precise measurements. Provided that the cal
ibration and measurements are made properly, this method can be used i
n estimating the section thickness, optical disector heights, and in p
articular in the determination of the thickness sampling fraction fur
the optical fractionator.