ESTIMATION OF THE SECTION THICKNESS AND OPTICAL DISECTOR HEIGHT WITH A SIMPLE CALIBRATION METHOD

Citation
A. Korkmaz et L. Tumkaya, ESTIMATION OF THE SECTION THICKNESS AND OPTICAL DISECTOR HEIGHT WITH A SIMPLE CALIBRATION METHOD, Journal of Microscopy, 187, 1997, pp. 104-109
Citations number
19
Categorie Soggetti
Microscopy
Journal title
ISSN journal
00222720
Volume
187
Year of publication
1997
Part
2
Pages
104 - 109
Database
ISI
SICI code
0022-2720(1997)187:<104:EOTSTA>2.0.ZU;2-G
Abstract
The distance between the upper and lower surfaces of a section (i.e. t he section thickness) can be measured with a microcator or a shaft enc oder. In the present report, an alternative simple method is described for estimating the section thickness where such equipment is not avai lable. The basic principle of the method is based on a calibration met hod already described in the literature, The main difference is that i t enables one to make more precise measurements. Provided that the cal ibration and measurements are made properly, this method can be used i n estimating the section thickness, optical disector heights, and in p articular in the determination of the thickness sampling fraction fur the optical fractionator.