STRUCTURAL CHARACTERISTICS OF LEAD-ZIRCONATE-TITANATE PIEZOELECTRIC FILMS AROUND MORPHOTROPIC PHASE-BOUNDARY

The structural characteristics of Lead-zirconate-titanate solid soluti on around the Morphotropic Phase Boundary was investigated using X-ray diffractometry and Raman spectroscopy. The rhombohedral-tetragonal tr ansformation was induced by firing the screen-printed PZT thick films between 960 degrees C and 1200 degrees C or annealing the laser-ablate d PZT thin films between 500 degrees C and 900 degrees C. During the p rocessing, lead was gradually evaporated, causing the composition of f ilms moved from the original rhombohedral region to the tetragonal reg ion. The XRD measurements showed the transformation starting at about 1000 degrees C for the thick films and about 900 degrees C for the thi n films. But the Raman measurements show different results. This discr ency indicates certain particular aspects of this transformation which are interpreted in a non-equilibrium displacement model.