PLZT/LSCO/ITO/Si textured multilayer films were prepared using the rf-
magnetron sputtering method. La0.5Sr0.5CoO3 (LSCO) films as the bottom
electrode have been grow in situ on Si with a conductive ITO buffer l
ayer with RF sputtering. The LSCO film orientated in the (100) directi
on deposited at 600 degrees C. The sheet resistance of LSCO/ITO compos
ite electrode is about 100 Ohm/square. The PLZT(8/65/35) films have be
en deposited on the substrates textured LSCO/ITO/Sistructure by RF spu
ttering with the PLZT powder targets. The PLZT films with a pure perov
skite structure and highly prefer orientation along (100) direction ca
n be obtained when the deposition temperature is 580 degrees C. The fi
lms obtained in this study show a high resistivity of over 10(10)Ohm.c
m and low dielectric loss tan delta in the range of 0.01-0.03.