A 2-DIMENSIONAL X-RAY-SCATTERING SYSTEM FOR IN-SITU TIME-RESOLVING STUDIES OF POLYMER STRUCTURES SUBJECTED TO CONTROLLED DEFORMATIONS

A two-dimensional X-ray scattering system developed around a CCD-based area detector is presented, both in terms of hardware employed and so ftware designed and developed. An essential feature is the integration of hardware and software, detection and sample environment control wh ich enables time-resolving in-situ wide-angle X-ray scattering measure ments of global structural and orientational parameters of polymeric s ystems subjected to a variety of controlled external fields. The devel opment and operation of a number of rheometers purpose-built for the a pplication of such fields are described. Examples of the use of this s ystem in monitoring degrees of shear-induced orientation in liquid-cry stalline systems and crystallization of linear polymers subsequent to shear flow are presented.