Aa. Gutkin et al., POLARIZATION PHOTOLUMINESCENCE STUDY OF THE COMPLEX VGATEAS IN N-TYPEGAAS IN THE TEMPERATURE-RANGE 77-230 K, Semiconductors, 31(9), 1997, pp. 908-915
The polarization of the photoluminescence band with a maximum near 1.1
8 eV, which is formed as a result of the resonance excitation of VGaTe
As complexes by polarized light, is investigated for GaAs:Te with vari
ous electron densities irm the temperature range 77-230 K. Based on a
previously developed model of these defects, theoretical equations for
the polarization of their luminescence are derived in the one-dipole
approximation, taking into account the possible reorientation of Jahn-
Teller distortions of the complexes. It is shown that the temperature
dependence of the polarization of the investigated band is well descri
bed by these equations, and the: parameters characterizing the optical
dipoles of the complexes are estimated. A decrease in the degree of p
olarization at temperatures above similar to 120 K is explained by the
transfer of excitation to complexes with any possible orientations of
the initial axis and by Jahn-Teller distortion (owing to thermal-fiel
d emission and retrapping of holes by the photoexcited complexes). The
decrease in polarization can also be partially linked to the reorient
ation of distortions during the lifetime of the emitting state of the
complex. The height of the energy barrier for such reorientation is at
least similar to 200 meV. (C) 1997 American Institute of Physics.