ELECTROREFLECTANCE OF SURFACE-INTRINSIC-N(-TYPE DOPED GAAS())

Citation
Dp. Wang et al., ELECTROREFLECTANCE OF SURFACE-INTRINSIC-N(-TYPE DOPED GAAS()), Journal of applied physics, 82(6), 1997, pp. 3089-3091
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
82
Issue
6
Year of publication
1997
Pages
3089 - 3091
Database
ISI
SICI code
0021-8979(1997)82:6<3089:EOSDG>2.0.ZU;2-Q
Abstract
The electroreflectance spectra of surface-intrinsic-n(+)-type-doped Ga As were measured at various bias voltages (V-bias). Results revealed m any Franz-Keldysh oscillations (FKOs) above the band-gap energy, which have been attributed to a uniform electric field (F) in the undoped l ayer below the surface. However, there has been no other evidence for the uniformity of F in the undoped layer. Since it is known that F can be deduced from the periods of the FKOs, the relations between F and V-bias can, thereby, be obtained. The nearly linear relation, thus fou nd, confirms the existence of a nearly uniform field in the undoped la yer. From the plot of F against V-bias,the Values of the thickness of the undoped layer and the barrier height can also be evaluated. (C) 19 97 American Institute of Physics.