GRAZING-INCIDENCE REFLECTIVITY AND TOTAL ELECTRON YIELD EFFECTS IN SOFT-X-RAY ABSORPTION-SPECTROSCOPY

Authors
ALDERS D HIBMA T SAWATZKY GA CHEUNG KC VANDORSSEN GE ROPER MD PADMORE HA VANDERLAAN G VOGEL J SACCHI M
Citation
D. Alders et al., GRAZING-INCIDENCE REFLECTIVITY AND TOTAL ELECTRON YIELD EFFECTS IN SOFT-X-RAY ABSORPTION-SPECTROSCOPY, Journal of applied physics, 82(6), 1997, pp. 3120-3124
Citations number
22
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
82
Issue
6
Year of publication
1997
Pages
3120 - 3124
Database
ISI
SICI code
0021-8979(1997)82:6<3120:GRATEY>2.0.ZU;2-R
Abstract
We report on a study of grazing incidence absorption and reflection sp ectra of NiO in the region of the Ni 2p edge. The aim is to evaluate t he distortion of the near edge spectrum by the critical angle behavior of individual components within the spectrum. This can be used to imp rove the separation of multiplets and enhance low spectral weight line shapes like charge transfer satellites. The measured spectra have bee n compared with calculations using an optical model. (C) 1997 American Institute of Physics.