A MODEL OF THE TEMKIN-ISOTHERM BEHAVIOR FOR HYDROGEN ADSORPTION AT PD-SIO2 INTERFACES

Citation
M. Eriksson et al., A MODEL OF THE TEMKIN-ISOTHERM BEHAVIOR FOR HYDROGEN ADSORPTION AT PD-SIO2 INTERFACES, Journal of applied physics, 82(6), 1997, pp. 3143-3146
Citations number
19
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
82
Issue
6
Year of publication
1997
Pages
3143 - 3146
Database
ISI
SICI code
0021-8979(1997)82:6<3143:AMOTTB>2.0.ZU;2-5
Abstract
A simple electrostatic model of the adsorbate-adsorbate interaction of hydrogen atoms at a Pd-SiO2 interface is presented. The model predict s a hydrogen adsorption isotherm of the Temkin type. It is found that, in practice, an upper limit for the hydrogen response of a Pd-metal-o xide-semiconductor device exists. The value (in V) is equal to the dif ference of the initial heats of adsorption (in eV) of the interface an d the Pd bulk, respectively. Furthermore, a corresponding maximum hydr ogen concentration, at the interface, of 1x10(18) m(-2) is predicted. The predictions are in good agreement with previously observed experim ental data. (C) 1997 American Institute of Physics.