J. Larjo et al., TEMPERATURE MAPPING OF REACTIVE GAS LAYER IN THERMAL PLASMA CHEMICAL-VAPOR-DEPOSITION, Journal of applied physics, 82(7), 1997, pp. 3560-3566
Two-dimensional temperature maps of reactive gas layers were produced
using pulsed laser Rayleigh scattering thermometry. The measurements w
ere made in conditions of diamond film chemical vapor deposition (CVD)
using a thermal inductively coupled plasma. In these conditions, the
reactive gas layer is typically a few millimeters thick and the temper
ature drops across the layer from 4000 K at the free stream boundary t
o about 1200 K at the substrate, The reactive layer exhibits strong ch
emical nonequilibrium. Rayleigh scattering was induced using a pulsed
laser sheet at 532 nm wavelength. The scattered radiation was detected
and calibrated with an intensified charge coupled device camera, Temp
erature maps and axial profiles obtained under parametric variation of
the gas flow conditions demonstrate how the technique can be employed
to measure the reactive layer thickness and its radial distribution a
cross the substrate. The results demonstrate that imaging Rayleigh sca
ttering thermometry can be employed as a nonintrusive diagnostic tool
to obtain useful experimental information pertinent to the gas phase c
hemistry in diamond CVD under conditions of extremely large temperatur
e gradients. (C) 1997 American Institute of Physics.