B. Unal et al., INTENSE VISIBLE PHOTOLUMINESCENCE FROM MOLECULAR-BEAM EPITAXY POROUS SI1-XGEX GROWN ON SI, Thin solid films, 305(1-2), 1997, pp. 274-279
The observation of strong visible photoluminescence (PL) from Molecula
r Beam Epitaxy (MBE) B-doped porous Si0.7Ge0.3 grown on p(-)-type Si w
afers are reported. The porous layers were formed by an electrochemica
l etching process with a range of preparative conditions. A significan
t shift in the emission energy of porous Si0.7Ge0.3 grown on Si has be
en observed for various anodization conditions and for the temperature
range 295-78 K. The PL emission energy has been found to remain almos
t unchanged on varying excitation energy, and to increase linearly wit
h reciprocal temperature, The position of the PL emission, however, wa
s observed to be strongly dependent upon the anodization current densi
ty and the duration of the etching process. The origin of visible PL o
f the porous MBE-SiGe films is interpreted by considering the quantum
confinement effect, as in the interpretation of PL from porous Si, and
the evolution of the SiGe Si-like band structure. (C) 1997 Elsevier S
cience S.A.