DISSOLUTION MECHANISM FOR P-SI DURING POROUS SILICON FORMATION

Authors
Citation
Y. Kang et J. Jorne, DISSOLUTION MECHANISM FOR P-SI DURING POROUS SILICON FORMATION, Journal of the Electrochemical Society, 144(9), 1997, pp. 3104-3111
Citations number
18
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
144
Issue
9
Year of publication
1997
Pages
3104 - 3111
Database
ISI
SICI code
0013-4651(1997)144:9<3104:DMFPDP>2.0.ZU;2-C
Abstract
The anodic polarizations of p-Si with various doping levels in concent rated HF solution have been studied. A theoretical model, based on the potential distribution during anodization, is developed. The computed polarization curves fit the experimental data quite well. Both the sp ace charge region and the Helmholtz interface control the anodic behav ior of p-Si. The effect of the Helmholtz interface becomes dominant as the doping level increases. The most likely dissolution mechanism dur ing porous silicon formation involves the capture of two holes to form Si(II), which further reacts with protons to produce Si(IV) and H-2 g as.