EXPERIMENTAL-EVIDENCE OF CHARACTERISTIC RELATIONS OF TYPE-I INTERMITTENCY IN AN ELECTRONIC-CIRCUIT

We experimentally observe the characteristic relations of type-I inter mittency [C.-M. Kim et al., Phys. Rev. Lett. 73, 525 (1994)] in an ind uctance-resistance-diode circuit. Near;a bifurcation point, the reinje ction probability distribution is of the form x(-1/2), and the charact eristic relations are of the form [l] proportional to epsilon(-1/4) an d constant when the lower bounds of the reinjection are at and above t he tangent point, respectively. The results agree well with theoretica l predictions.