THE APPLICATION OF DE-POLARIZATION ANALYSIS TO POLARIMETRIC CHARACTERIZATION AND CLASSIFICATION OF METALLIC AND DIELECTRIC SAMPLES

Citation
P. Elies et al., THE APPLICATION OF DE-POLARIZATION ANALYSIS TO POLARIMETRIC CHARACTERIZATION AND CLASSIFICATION OF METALLIC AND DIELECTRIC SAMPLES, Journal of physics. D, Applied physics, 30(18), 1997, pp. 2520-2529
Citations number
9
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
30
Issue
18
Year of publication
1997
Pages
2520 - 2529
Database
ISI
SICI code
0022-3727(1997)30:18<2520:TAODAT>2.0.ZU;2-V
Abstract
Reflection polarization transformations by a given sample depends both on the composition and surface state and on the illumination angle. I n the present work, the evolution of polarization transformation given by dielectric samples and metallic surfaces has been studied. The ini tial metallic surface was polished up to 1 mu m and then progressively debased. The polarimetric characteristics are described by using the Mueller matrix, which provides the depolarization index, namely the me an depolarization power, and the degree of polarization for all the pu re incident states of polarization. The polarization of each sample is measured for various angles of incidence. The noise is reduced by a s tatistical method to optimize the matrix elements. The results obtaine d are first presented in a global matrix form and then the depolarizat ion phenomenon is analysed. In the last step the studied samples are c haracterized and classified.