STRUCTURE-PROPERTY CORRELATIONS IN STRETCHED LLDPE FILMS USING OBLIQUE-INCIDENCE SMALL-ANGLE X-RAY-SCATTERING

This paper demonstrates the use of oblique incidence small-angle X-ray scattering (SAXS) to characterize microstructure in linear low-densit y polyethylene films subjected to biaxial deformation in a TM Long str etcher. Differences in tear strength and impact properties were found when two different deformation temperatures were used. SAXS was used t o characterize the nanometer scale microstructure of these films. Sinc e the microstructure was expected to be anisotropic, SAXS data were co llected in normal incidence, T (transverse) oblique incidence and M (r eference direction) oblique incidence. The sections through the three- dimensional SAXS pattern collected in these three orientations are com bined to provide clues to the nature of the complete 3-D SAXS pattern, which can be interpreted to characterize the changes wrought by defor mation.