SIMPLE VISUAL REACTION-TIME IN ORGANOLEAD MANUFACTURING WORKERS - COMPARISON OF DIFFERENT METHODS OF MODELING LEAD-EXPOSURE AND REACTION-TIME

Citation
Jm. Balbus et al., SIMPLE VISUAL REACTION-TIME IN ORGANOLEAD MANUFACTURING WORKERS - COMPARISON OF DIFFERENT METHODS OF MODELING LEAD-EXPOSURE AND REACTION-TIME, American journal of industrial medicine, 32(5), 1997, pp. 544-549
Citations number
15
Categorie Soggetti
Public, Environmental & Occupation Heath
ISSN journal
02713586
Volume
32
Issue
5
Year of publication
1997
Pages
544 - 549
Database
ISI
SICI code
0271-3586(1997)32:5<544:SVRIOM>2.0.ZU;2-P
Abstract
In March 1990, 222 organolead manufacturing workers and 62 nonexposed referents were administered a neurobehavioral test battery that includ ed simple visual reaction time (SVRT). SVRT was measured over 44 trial s with interstimulus intervals ranging from 1 to 10 sec in a random bu t fixed order for all study subjects. Different measures of lead expos ure and dose (e.g., recent and cumulative exposure based on personal s ampling data, exposed/nonexposed status, recent blood lead and zinc pr otoporphyrin levels, and peak and cumulative urine lead levels) were e xamined as predictors of several different parameters of SVRT (e.g., m ean, median, truncated mean, and standard deviation of SVRT over 44 tr ials). The association varied, depending on the measures used for SVRT and lead exposure and dose. In linear regression analyses, the strong est and most consistent associations of lead exposure and dose were ob served with the standard deviation of SVRT. In assessing the different exposure measures, strong and consistent associations were observed w ith blood lead levels at the time of SVRT testing, but not with recent or cumulative exposure measures. That is, stronger associations were observed with measures of relatively recent internal dose (i.e., blood lead level) than with cumulative measures (i.e., cumulative exposure) . Future studies using SVRT should consider parameters of SVRT that ha ve not been commonly used to date, such as the standard deviation of S VRT. (C) 1997 Wiley-Liss, Inc.