Thin films are usually obtained by depositing atoms with a continuous
flux. We show that using a chopped flux changes the growth and morphol
ogy of the film. A simple scaling analysis predicts how the island den
sities change as a function of the frequency of the chopped flux in si
mple cases where aggregation is irreversible. These predictions are co
nfirmed by computer simulations. We show that the model can be used to
obtain information on the diffusion or evaporation of the adatoms. Th
e model is also useful for understanding the growth of thin films prep
ared by pulsed sources. (C) 1997 Elsevier Science B.V.