DETERMINATION OF THE INTERFACE STRUCTURAL MORPHOLOGY FROM GRAZING-INCIDENCE X-RAY-DIFFRACTION DATA USING DYNAMICAL THEORY

A scheme based on X-ray dynamical theory is developed to analyze grazi ng-incidence X-ray diffraction data and to determine the interface str uctural morphology efficiently with a number of fitting parameters rel ated to the phases and magnitude of the electric susceptibilities. Thi s scheme is applied to surface normal-scans to study the relatively co mplex interface structure of the YSZ/MgO(001) system. II is found that the interface is composed of three types of crystallites of the c-elo ngated tetragonal structure with thicknesses of about 300, 150 and 50 Angstrom in the direction normal to the interface. The related structu ral parameters are also deduced. (C) 1997 Elsevier Science B.V.