Ts. Gau et al., DETERMINATION OF THE INTERFACE STRUCTURAL MORPHOLOGY FROM GRAZING-INCIDENCE X-RAY-DIFFRACTION DATA USING DYNAMICAL THEORY, Surface science, 384(1-3), 1997, pp. 254-259
A scheme based on X-ray dynamical theory is developed to analyze grazi
ng-incidence X-ray diffraction data and to determine the interface str
uctural morphology efficiently with a number of fitting parameters rel
ated to the phases and magnitude of the electric susceptibilities. Thi
s scheme is applied to surface normal-scans to study the relatively co
mplex interface structure of the YSZ/MgO(001) system. II is found that
the interface is composed of three types of crystallites of the c-elo
ngated tetragonal structure with thicknesses of about 300, 150 and 50
Angstrom in the direction normal to the interface. The related structu
ral parameters are also deduced. (C) 1997 Elsevier Science B.V.