THE SCHONLAND MICRO-SCANNING ION-BEAM ANALYSIS FACILITY

The Schonland Micro-Scanning Ion Beam Analysis Facility is used for in terdisciplinary research, uniting physics and many other disciplines. It has a unique dual accelerator input configuration. A wide range of high energy heavy and light ions is available from an EN Tandem van de Graaff accelerator with 6.0 MV terminal voltage. Light ions at lower energy but with much increased luminosity are available from a 2.5 MV single-ended van de Graaff accelerator. The sample chamber is equipped to image radiation and particles from a wide range of ion-beam intera ctions with matter. These include the ion beam analytical techniques o f RBS, ERDA, PIXE, NRA, SecEM and STIM. Some of these techniques have been performed tomographically or under channeling conditions. Sub-or near-micron spot sizes for many of these techniques are available. The user interface to the sample chamber is highly automated, allowing sa fe and friendly interaction. The OMDAQ system developed at Oxford Univ ersity is dedicated to on-line acquisition and preliminary analysis of singles spectra. The Physics Analysis Workstation (PAWS++) system dev eloped for CERN and ported to a CAMAC-PC environment manages the more sophisticated multi-parameter acquisition and post-processing. (C) 199 7 Elsevier Science B.V.